Structured RF, microwave, electromagnetic, and semiconductor characterization with continuous coverage from DC through 40 GHz. All work is performed in a controlled laboratory environment using instrumentation from established manufacturers including Hewlett-Packard (HP), Agilent Technologies, Tektronix, Anritsu, and Rohde & Schwarz.
| Capability | Range / Performance | Notes |
|---|---|---|
| Frequency Coverage | Continuous DC – 40 GHz | Vector network and spectrum-based analysis |
| Vector Network Analysis | DC – 40 GHz | S-parameters, gain, return loss, impedance |
| Spectrum Analysis | DC – 40 GHz | Signal identification, harmonic analysis, spurious evaluation |
| Time Domain Reflectometry | DC – 40 GHz | |
| Phase Noise (Cross-Correlation) | Up to 200 MHz | True cross-correlation architecture for improved noise floor |
| Phase Noise (Direct Spectrum) | Up to 40 GHz | Direct spectrum method for high-frequency oscillators |
| Capability | Performance | Notes |
|---|---|---|
| Frequency Stability (ADEV) | Allan deviation to 1e-15 (application dependent) | Traceable reference standards |
| Oscillator Characterization | DC – 40 GHz | Phase noise, drift, stability evaluation |
| Reference Verification | Precision timebase comparison | Controlled laboratory environment |
| Capability | Scope | Notes |
|---|---|---|
| Conducted Emissions | Pre-compliance evaluation | LISN-based diagnostics |
| Near-Field Probing | Localized emission identification | Leakage source identification and quantification |
| TEM / GTEM Evaluation | Engineering assessment | Design-stage diagnostics only |
| Radiated Emissions Survey | Pre-compliance screening | Peak and Quasi-peak detectors available |
Microwave Analytics provides engineering-focused pre-compliance evaluation. Formal certification testing is not performed onsite.
| Capability | Electrical Range | Notes |
|---|---|---|
| I-V Curve Tracing | Up to ±200 V / ±1 A (application dependent) | High-power device characterization |
| C-V Characterization | Precision capacitance evaluation | HP 4156C parameter analyzer |
| Parameter Extraction | Device-level analysis | Semiconductor evaluation |
| RF Capacitance / Inductance | Up to 3 GHz | Impedance and reactive component analysis |
Semiconductor characterization is performed on packaged components or fixture-mounted devices. Wafer-level probe station measurements are not supported.
Microwave Analytics produces structured technical reports suitable for engineering documentation, internal design review, and program-level reporting.
Reports typically include:
Representative redacted reports are available upon request.